APPLICATION OF SEMICONDUCTID STRAIN GAGES FOR RESIDUAL STRESS DETERMINATION
Velikost:
321.86 kB
Autor:
Karel Vítek, Karel Doubrava, Stanislav Holý, Ladislav Hrubant
Datum:
22. prosinec 2017
Autor:
Karel Vítek, Karel Doubrava, Stanislav Holý, Ladislav Hrubant