SEMICONDUCTOR STRAIN GAUGES IN EXPERIMENTAL STRESS ANALYSIS, THEIR ADVANTAGES AND LIMITATIONS
SEMICONDUCTOR STRAIN GAUGES IN EXPERIMENTAL STRESS ANALYSIS, THEIR ADVANTAGES AND LIMITATIONS
Velikost:
241.50 kB
Autor:
Ladislav Hrubant, Jan Hrubant
Datum:
22. prosinec 2017
Autor:
Ladislav Hrubant, Jan Hrubant